James McGinley

Principal Functional Safety Architect, Autonomous Transport Analog Devices

Pre-conference Workshop Day

11:00 AM WORKSHOP 4: THE IMPACT OF SOTIF ON THE SEMICONDUCTOR COMPANIES

Focus: SOTIF within the semiconductor industry

Safety of the intended functionality considers hazardous behaviour in the absence of faults. While it may seem like this limits the domain to that of the vehicle, ISO/PAS 21448 clearly states that its “activities are applicable to the vehicle, system and component levels”. This workshop offers a closer look into what ISO/PAS 21448 means for development of semiconductor components in concrete terms. Topics discussed will include:

Understanding the relevant parts of ISO/PAS 21448 for semiconductor companies
Explore whether SOTIF impacts existing interaction models between semiconductor companies and the Tier 1 and OEM communities

Does SOTIF drive additional semiconductor safety analysis?
Examine options for adapting existing automotive QMS and functional safety lifecycles to support SOTIF

Consider whether SOTIF impacts digital, analogue and mixed-signal developments differently

Check out the incredible speaker line-up to see who will be joining James.

Download The Latest Agenda

In Partnership With:

Connect With Us

Questions?

Tel: +49 30 52001534

E-mail: eq@iqpc.de

Imprint:
Company information according to § 5 Telemediengesetz
IQPC Gesellschaft für Management Konferenzen mbH
Address: Rosenstrasse 2, 10178 Berlin, Germany
Tel: 49 30 52 001 534
E-mail: info@iqpc.de
Registered at: Amtsgericht Charlottenburg, HRB 76720
VAT-Number: DE210454451
Management: Torben Haagh, Richard A. Worden, Michael R. Worden

Impressum:
Firmeninformationen entsprechend § 5 Telemediengesetz
IQPC Gesellschaft für Management Konferenzen mbH
Adresse: Rosenstrasse 2, 10178 Berlin, Germany
Telefonnummer: 030 52001534
Email Adresse: info@iqpc.de
Registereintragungen: Amtsgericht Charlottenburg HRB 76720
Umsatzsteuer- Indentifikationsnummer DE210454451
Geschäftsführung: Torben Haagh, Richard A. Worden, Michael R. Worden